Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: EPL (Europhysics Letters)
سال: 2020
ISSN: 1286-4854
DOI: 10.1209/0295-5075/131/10008